Mag.Dr. Christina Hirschl

Search results

• 2021

  Deep learning based image feature extraction for predicting climate related degradation of PV modules

  Neumaier, L., Scherer, J., Schwarzlmüller, C. H., Kubicek, B., Mödritscher, F. & Hirschl, C., 6 Sept 2021, EU PVSEC Conference Proceedings.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

  • Deep learning 100%
  • Electroluminescence 88%
  • Feature extraction 86%
  • Degradation 78%
  • Defects 76%

• Erweitertes PV Anlagenmonitoring kann Wartungsnotwendigkeit aufzeigen

  Mühleisen, W., Neumaier, L., Kosel, J., Hirschl, C., Rattenberger, R. & Prasser, P., Feb 2021, Tagungsband Ret.Con 2021.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

• Improved Eddy-Current Probe for Non-Destructive Characterization of Electrical Contacts in PV Modules

  Neumaier, L., Lenzhofer, M., Hirschl, C. & Kosel, J., 6 Sept 2021, EU PVSEC Conference Proceedings.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

  • inspection 100%
  • eddy 92%
  • probe 87%
  • quality control 51%
  • sensor 37%

• PV plant monitoring needs both – data analysis and on-site inspection

  Mühleisen, W., Neumaier, L., Kosel, J., Hirschl, C., Rattenberger, R. & Prasser, P., Sept 2021, (In preparation) EU PVSEC Conference Proceedings.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper

  • photovoltaic system 100%
  • inspection 67%
  • data analysis 60%
  • shading 41%
  • need 39%
• 2020

  Eddy-Current Analysis Method for Non-Destructive Characterization of Electrical Contacts and Solder Joints in PV Modules

  Neumaier, L., Mühleisen, W., Lenzhofer, M., Malago, P. & Hirschl, C., 7 Sept 2020, EU PVSEC Conference Proceedings. 37 ed. p. 904 - 907 4 p.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

  Open Access

  • eddy 100%
  • conductivity 47%
  • encapsulation 36%
  • hot spot 31%
  • analysis 31%

• Operation and Evaluation of a Bifacial PV Module Test Setup

  Mühleisen, W., Neumaier, L., Hirschl, C., Löschnig, J., Burgers, T., Bende, E. & Zamini, S., Sept 2020, EU PVSEC Conference Proceedings.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

  • albedo 100%
  • roof 95%
  • evaluation 75%
  • test 61%
  • pollution 34%

• The Need for an Accuracy Check of Irradiation Sensors for Photovoltaic Power Plants

  Mühleisen, W., Neumaier, L., Hirschl, C., Makula, M., Streit, B., Gräfe, M. & Gradwohl, C., Sept 2020, EU PVSEC Conference Proceedings.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

  • Irradiation 100%
  • Power plants 80%
  • Sensors 50%
  • Silicon solar cells 33%
  • Photodiodes 30%
• 2018

  Defect detection in high quality polymers used in the semiconductor manufacturing industry

  Hirschl, C., Arnold, T., Meislitzer, S., Moldaschl, T., De Biasio, M., Neumaier, L., Molzbichler, A., Cramer, H., Oreski, G. & Kraft, M., 2018, Smart Systems Integration 2018 - International Conference and Exhibition on Integration Issues of Miniaturized Systems.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

• 2017

  Detection and identification of foreign bodies in polymer parts for use in semiconductor manufacturing

  Arnold, T., Meislitzer, S., Moldaschl, T., De Biasio, M., Neumaier, L., Leitner, R., Ottersböck, B., Oreski, G., Kraft, M. & Hirschl, C., 2017, Proceedings of SPIE - The International Society for Optical Engineering.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

• Low silver content, lead free modules with light capturing ribbons

  Schwark, M., Mühleisen, W., Neumaier, L. & Hirschl, C., 2017, 2017 6th International Conference on Clean Electrical Power: Renewable Energy Resources Impact, ICCEP 2017.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

• Non-contact measurement of silicon thin wafer warpage by THz tomography and laser triangulation

  Arnold, T., Schicker, J., Kraft, M. & Hirschl, C., 2017, Proceedings of IEEE Sensors.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
• 2016

  Raman-based inspection for non-destructive, inline quality control to enable smart production in photovoltaic industry

  Neumaier, L., Hirschl, C., Berge, C. & Rüland, E., 2016, Smart Systems Integration 2016 - International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2016.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

• 2015

  Inspection of mechanical and electrical properties of silicon wafers using terahertz tomography and spectroscopy

  Arnold, T., Muehleisen, W., Schicker, J. & Hirschl, C., 2015, Proceedings of SPIE - The International Society for Optical Engineering.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

• Simulation of the deformation behaviour of large thin silicon wafers and comparison with experimental findings

  Schicker, J., Arnold, T., Hirschl, C., Iravani, A. & Kraft, M., 2015, 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2015.

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
• 2013

  Investigation of potential induced degradation (PID) of solar modules from different manufacturers

  Schwark, M., Berger, K., Ebner, R., Ujvari, G., Hirschl, C., Neumaier, L. & Muhleisen, W., 2013, IECON Proceedings (Industrial Electronics Conference).

  Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review