Raman-based inspection for non-destructive, inline quality control to enable smart production in photovoltaic industry

L. Neumaier, C. Hirschl, C. Berge, E. Rüland

Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

Original language	Undefined/Unknown
Title of host publication	Smart Systems Integration 2016 - International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2016
Publication status	Published - 2016

Cite this

@inproceedings{3692525bda8a45b1b41ca9dfc3fa03c0,

title = "Raman-based inspection for non-destructive, inline quality control to enable smart production in photovoltaic industry",

author = "L. Neumaier and C. Hirschl and C. Berge and E. R{\"u}land",

year = "2016",

language = "undefiniert/unbekannt",

booktitle = "Smart Systems Integration 2016 - International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2016",

}

Raman-based inspection for non-destructive, inline quality control to enable smart production in photovoltaic industry. / Neumaier, L.; Hirschl, C.; Berge, C. et al.
Smart Systems Integration 2016 - International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2016. 2016.

Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

TY - GEN

T1 - Raman-based inspection for non-destructive, inline quality control to enable smart production in photovoltaic industry

AU - Neumaier, L.

AU - Hirschl, C.

AU - Berge, C.

AU - Rüland, E.

PY - 2016

Y1 - 2016

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84976295607&partnerID=MN8TOARS

M3 - Konferenzartikel

BT - Smart Systems Integration 2016 - International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2016

ER -