Fingerprint
Dive into the research topics of 'A New Data Fitting Method for Parasitic Impedances of Power Transistor Packages using Two-Port S-Parameter Measurements'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A New Data Fitting Method for Parasitic Impedances of Power Transistor Packages using Two-Port S-Parameter Measurements
Thomas Moldaschl, Stefan Woetzel, Maurizio Galvano, Christoph Mayer, Herbert Hackl, Alfred Binder
Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review