TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs

C. Fleury, G. Notermans, H.-M. Ritter, D. Pogany

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronics Reliability
DOIs	https://doi.org/10.1016/j.microrel.2017.06.070
Publication status	Published - 2017

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TY - JOUR

T1 - TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs

AU - Fleury, C.

AU - Notermans, G.

AU - Ritter, H.-M.

AU - Pogany, D.

PY - 2017

Y1 - 2017

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-85021428710&partnerID=MN8TOARS

U2 - 10.1016/j.microrel.2017.06.070

DO - 10.1016/j.microrel.2017.06.070

M3 - Artikel

SN - 0026-2714

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -