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Spectroscopic ellipsometry of anisotropic AlScN pseudobinary alloys
Dmytro Solonenko
Thin Film Technologies (TFT)
Research output
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Contribution to conference (No Proceedings)
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Dive into the research topics of 'Spectroscopic ellipsometry of anisotropic AlScN pseudobinary alloys'. Together they form a unique fingerprint.
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Physics & Astronomy
ellipsometry
100%
nitrides
47%
wurtzite
33%
textures
28%
electronics
26%
scandium
21%
fluorite
20%
ferroelectric materials
20%
integrity
18%
microelectronics
17%
atomic structure
17%
epitaxy
16%
hardware
16%
heterojunctions
15%
absorptivity
14%
sapphire
14%
excitons
13%
physical properties
13%
alignment
13%
vapor deposition
13%
computer programs
12%
mechanical properties
11%
ground state
11%
impurities
11%
optical properties
11%
physics
10%
single crystals
10%
microstructure
10%
characterization
9%
thin films
8%
performance
7%
energy
5%