On an optimal control applied in atomic force microscopy (AFM) including fractional-order

A.M. Tusset, J.M. Balthazar, J.J. De Lima, R.T. Rocha, F.C. Janzen, P.S. Yamaguchi

Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the ASME Design Engineering Technical Conference
DOIs	https://doi.org/10.1115/DETC2017-67536
Publication status	Published - 2017
Externally published	Yes

Access to Document

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title = "On an optimal control applied in atomic force microscopy (AFM) including fractional-order",

author = "A.M. Tusset and J.M. Balthazar and {De Lima}, J.J. and R.T. Rocha and F.C. Janzen and P.S. Yamaguchi",

year = "2017",

doi = "10.1115/DETC2017-67536",

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booktitle = "Proceedings of the ASME Design Engineering Technical Conference",

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T1 - On an optimal control applied in atomic force microscopy (AFM) including fractional-order

AU - Tusset, A.M.

AU - Balthazar, J.M.

AU - De Lima, J.J.

AU - Rocha, R.T.

AU - Janzen, F.C.

AU - Yamaguchi, P.S.

PY - 2017

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U2 - 10.1115/DETC2017-67536

DO - 10.1115/DETC2017-67536

M3 - Konferenzartikel

BT - Proceedings of the ASME Design Engineering Technical Conference

ER -