On an optimal control applied in atomic force microscopy (AFM) including fractional-order

A.M. Tusset, J.M. Balthazar, J.J. De Lima, R.T. Rocha, F.C. Janzen, P.S. Yamaguchi

Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

Originalsprache	undefiniert/unbekannt
Titel	Proceedings of the ASME Design Engineering Technical Conference
DOIs	https://doi.org/10.1115/DETC2017-67536
Publikationsstatus	Veröffentlicht - 2017
Extern publiziert	Ja

Zugriff auf Dokument

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title = "On an optimal control applied in atomic force microscopy (AFM) including fractional-order",

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year = "2017",

doi = "10.1115/DETC2017-67536",

language = "undefiniert/unbekannt",

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AU - Tusset, A.M.

AU - Balthazar, J.M.

AU - De Lima, J.J.

AU - Rocha, R.T.

AU - Janzen, F.C.

AU - Yamaguchi, P.S.

PY - 2017

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BT - Proceedings of the ASME Design Engineering Technical Conference

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