Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films

R. Resel, M. Bainschab, A. Pichler, T. DIngemans, C. Simbrunner, J. Stangl, I. Salzmann

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Journal of Synchrotron Radiation
DOIs	https://doi.org/10.1107/S1600577516003672
Publication status	Published - 2016
Externally published	Yes

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author = "R. Resel and M. Bainschab and A. Pichler and T. DIngemans and C. Simbrunner and J. Stangl and I. Salzmann",

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T1 - Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films

AU - Resel, R.

AU - Bainschab, M.

AU - Pichler, A.

AU - DIngemans, T.

AU - Simbrunner, C.

AU - Stangl, J.

AU - Salzmann, I.

PY - 2016

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DO - 10.1107/S1600577516003672

M3 - Artikel

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

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