Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films

R. Resel, M. Bainschab, A. Pichler, T. DIngemans, C. Simbrunner, J. Stangl, I. Salzmann

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Originalsprache	undefiniert/unbekannt
Fachzeitschrift	Journal of Synchrotron Radiation
DOIs	https://doi.org/10.1107/S1600577516003672
Publikationsstatus	Veröffentlicht - 2016
Extern publiziert	Ja

Zugriff auf Dokument

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title = "Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films",

author = "R. Resel and M. Bainschab and A. Pichler and T. DIngemans and C. Simbrunner and J. Stangl and I. Salzmann",

year = "2016",

doi = "10.1107/S1600577516003672",

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TY - JOUR

T1 - Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films

AU - Resel, R.

AU - Bainschab, M.

AU - Pichler, A.

AU - DIngemans, T.

AU - Simbrunner, C.

AU - Stangl, J.

AU - Salzmann, I.

PY - 2016

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DO - 10.1107/S1600577516003672

M3 - Artikel

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

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