Abstract
Evanescent field particle scattering is a promising method for single particle detection. In this study, we performed a detailed numerical analysis to show the possibilities and limitations of analytical models for predicting the capabilities of this sensing mechanism.
Original language | English |
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Title of host publication | 4th International Conference nanoFIS 2020 - Functional Integrated nanoSystems |
DOIs | |
Publication status | Published - 2020 |