Localization Of Vertical Breakdown Spots In Normally-Off And Normally-On Algan/gan HEMTs On SiC And Si Substrates

C. Fleury, S. Bychikhin, M. Cappriotti, O. Hilt, R. Zhytnytska, J. Würfl, J. Derluyn, D. Visalli, G. Strasser, D. Pogany

    Research output: Contribution to conference (No Proceedings)Paper

    Original languageUndefined/Unknown
    Pages159-160
    Publication statusPublished - 1 May 2013

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