Abstract
Aluminum nitride (AlN) on sapphire is a promising substrate for SAW (surface acoustic wave) sensors operating at high temperatures and high frequencies. To get an experimental measure of the suitability and temperature stability of such devices, several samples of SAW delay lines were fabricated on 2" c-plane (0001) sapphire substrates with 1 μm c-plane AlN layer on top. Time- and frequency responses were recorded during annealing treatments at temperatures up to 850°C and the signals were analyzed afterwards.
Original language | English |
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Title of host publication | 2010 IEEE International Frequency Control Symposium |
Pages | 499-502 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 4 Jun 2010 |
Externally published | Yes |
Event | 2010 IEEE International Frequency Control Symposium - Newport Beach, CA, USA Duration: 1 Jun 2010 → 4 Jun 2010 |
Conference
Conference | 2010 IEEE International Frequency Control Symposium |
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Period | 1/06/10 → 4/06/10 |
Keywords
- Temperature measurement
- Temperature sensors
- Substrates
- Delay lines
- Delay
- Plasma temperature
- Electrodes