Original language | English |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
DOIs | |
Publication status | Published - 2012 |
Investigation of optically injected charge carrier dynamics in silicon wafers using terahertz spectroscopic imaging
T. Arnold, M. De Biasio, W. Muehleisen, R. Leitner
Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review