Investigation of optically injected charge carrier dynamics in silicon wafers using terahertz spectroscopic imaging

T. Arnold, M. De Biasio, W. Muehleisen, R. Leitner

Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

Originalsprache	Englisch
Titel	Proceedings of SPIE - The International Society for Optical Engineering
DOIs	https://doi.org/10.1117/12.919061
Publikationsstatus	Veröffentlicht - 2012

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title = "Investigation of optically injected charge carrier dynamics in silicon wafers using terahertz spectroscopic imaging",

author = "T. Arnold and {De Biasio}, M. and W. Muehleisen and R. Leitner",

year = "2012",

doi = "10.1117/12.919061",

language = "English",

isbn = "0277786X",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - GEN

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AU - Arnold, T.

AU - De Biasio, M.

AU - Muehleisen, W.

AU - Leitner, R.

PY - 2012

Y1 - 2012

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U2 - 10.1117/12.919061

DO - 10.1117/12.919061

M3 - Conference Paper

SN - 0277786X

BT - Proceedings of SPIE - The International Society for Optical Engineering

ER -