Original language | English |
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Title of host publication | 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings |
DOIs | |
Publication status | Published - 2012 |
Investigation of charge carrier dynamics in silicon wafers using terahertz imaging spectroscopy
T. Arnold, M. De Biasio, W. Mühleisen, R. Leitner
Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review