High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials

Andreas Och, Patrick A. Hölzl, Stefan Schuster, Jochen O. Schrattenecker, Philipp F. Freidl, Stefan Scheiblhofer, Dominik Zankl, Venkata Pathuri-Bhuvana, Robert Weigel

    Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

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    Physics & Astronomy