@inproceedings{7cbab48428654869997ad05ac0a303c5,
title = "High-Resolution Millimeter-Wave Tomography System for Characterization of Low-Permittivity Materials",
abstract = "Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79 GHz high-resolution tomography system enabling characterization of materials with relative permittivity close to one. It is based on fully-integrated frequency-modulated continuous-wave radar transceivers which significantly reduce cost and complexity. A first prototype is built with two radar sensors and a rotary stage to emulate a higher sensor count. The medium-dependent time-of-flight through the area-under-test is evaluated and Tikhonov regularization is applied to solve the inverse problem and reconstruct a 2D image. System simulations and measurements with low-permittivity foam objects confirm the feasibility of this approach.",
keywords = "Millimeter wave radar, Nondestructive testing, Permittivity, Radar imaging, Time of arrival estimation, Tomography",
author = "Andreas Och and H{\"o}lzl, {Patrick A.} and Stefan Schuster and Schrattenecker, {Jochen O.} and Freidl, {Philipp F.} and Stefan Scheiblhofer and Dominik Zankl and Venkata Pathuri-Bhuvana and Robert Weigel",
year = "2020",
month = aug,
day = "6",
doi = "10.1109/IMS30576.2020.9224048",
language = "English",
isbn = "9781728168166",
series = "IEEE MTT-S International Microwave Symposium Digest",
publisher = "IEEE Computer Society",
pages = "365--368",
booktitle = "IEEE MTT-S International Microwave Symposium Digest",
address = "United States",
note = "2020 IEEE/MTT-S International Microwave Symposium (IMS) ; Conference date: 04-08-2020 Through 06-08-2020",
}