Original language | Undefined/Unknown |
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Journal | Microelectronics Reliability |
DOIs | |
Publication status | Published - 2015 |
ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique
M. Rigato, C. Fleury, M. Heer, M. Capriotti, W. Simbürger, D. Pogany
Research output: Contribution to journal › Article › peer-review