Dark field imaging system for size characterization of magnetic micromarkers

A. Malec, C. Haiden, G. Kokkinis, F. Keplinger, I. Giouroudi

Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
DOIs	https://doi.org/10.1117/12.2267943
Publication status	Published - 2017
Externally published	Yes

Access to Document

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title = "Dark field imaging system for size characterization of magnetic micromarkers",

author = "A. Malec and C. Haiden and G. Kokkinis and F. Keplinger and I. Giouroudi",

year = "2017",

doi = "10.1117/12.2267943",

language = "undefiniert/unbekannt",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - GEN

T1 - Dark field imaging system for size characterization of magnetic micromarkers

AU - Malec, A.

AU - Haiden, C.

AU - Kokkinis, G.

AU - Keplinger, F.

AU - Giouroudi, I.

PY - 2017

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DO - 10.1117/12.2267943

M3 - Konferenzartikel

BT - Proceedings of SPIE - The International Society for Optical Engineering

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