Characterisation setup of SAW devices at high temperatures and ultra high frequencies

Jochen Bardong; Gudrun Bruckner; Georg Franz; Rene Fachberger; Artur Erlacher

doi:10.1109/FREQ.2009.5168136

Characterisation setup of SAW devices at high temperatures and ultra high frequencies

Jochen Bardong, Gudrun Bruckner, Georg Franz, Rene Fachberger, Artur Erlacher

Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

Abstract

A HT stable measurement setup for SAW devices operating at UHF has been developed. It is based on a ceramic chip carrier clamped on a metal ground plate that can be inserted into a tube oven and interrogated via coaxial cables. All interconnections except for the SAW device itself are clamped with metallic springs. Thus, the chip carrier can easily be inserted and removed from the measurement setup. The selected geometry and materials allow a simultaneous operation up to frequencies of 3.5 GHz and temperatures of 1000degC. To introduce the coaxial cables into the quartz glass tube, a vacuum tight feed through is used. So, influences of different atmospheres like laboratory air, inert gases or vacuum on the behavior of the SAW devices can be studied. Four similar test units can be inserted into the tube allowing in-situ measurements of up to four two port devices. The design aspects of the setup and first measurements of SAW test devices on langasite are presented.

Original language	English
Title of host publication	2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum
Pages	28-32
Number of pages	5
DOIs	https://doi.org/10.1109/FREQ.2009.5168136
Publication status	Published - 24 Apr 2009
Externally published	Yes
Event	2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum - Besancon, France Duration: 20 Apr 2009 → 24 Apr 2009

Conference

Conference	2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum
Period	20/04/09 → 24/04/09

Keywords

Surface acoustic wave devices
Frequency
Atmospheric measurements
Semiconductor device measurement
Coaxial cables
Testing
Land surface temperature
UHF measurements
Ceramics
Ovens

Access to Document

10.1109/FREQ.2009.5168136

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5168136

Cite this

@inproceedings{744f67d60e5a4a89809bcc3b78cf4eb1,

title = "Characterisation setup of SAW devices at high temperatures and ultra high frequencies",

abstract = "A HT stable measurement setup for SAW devices operating at UHF has been developed. It is based on a ceramic chip carrier clamped on a metal ground plate that can be inserted into a tube oven and interrogated via coaxial cables. All interconnections except for the SAW device itself are clamped with metallic springs. Thus, the chip carrier can easily be inserted and removed from the measurement setup. The selected geometry and materials allow a simultaneous operation up to frequencies of 3.5 GHz and temperatures of 1000degC. To introduce the coaxial cables into the quartz glass tube, a vacuum tight feed through is used. So, influences of different atmospheres like laboratory air, inert gases or vacuum on the behavior of the SAW devices can be studied. Four similar test units can be inserted into the tube allowing in-situ measurements of up to four two port devices. The design aspects of the setup and first measurements of SAW test devices on langasite are presented.",

keywords = "Surface acoustic wave devices, Frequency, Atmospheric measurements, Semiconductor device measurement, Coaxial cables, Testing, Land surface temperature, UHF measurements, Ceramics, Ovens",

author = "Jochen Bardong and Gudrun Bruckner and Georg Franz and Rene Fachberger and Artur Erlacher",

year = "2009",

month = apr,

day = "24",

doi = "10.1109/FREQ.2009.5168136",

language = "English",

isbn = "978-1-4244-3510-4",

pages = "28--32",

booktitle = "2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum",

note = "2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum ; Conference date: 20-04-2009 Through 24-04-2009",

}

Bardong, J , Bruckner, G, Franz, G, Fachberger, R & Erlacher, A 2009, Characterisation setup of SAW devices at high temperatures and ultra high frequencies. in 2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum., 5168136, pp. 28-32, 2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum, 20/04/09. https://doi.org/10.1109/FREQ.2009.5168136

Characterisation setup of SAW devices at high temperatures and ultra high frequencies. / Bardong, Jochen ; Bruckner, Gudrun; Franz, Georg et al.
2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum. 2009. p. 28-32 5168136.

Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review

TY - GEN

T1 - Characterisation setup of SAW devices at high temperatures and ultra high frequencies

AU - Bardong, Jochen

AU - Bruckner, Gudrun

AU - Franz, Georg

AU - Fachberger, Rene

AU - Erlacher, Artur

PY - 2009/4/24

Y1 - 2009/4/24

N2 - A HT stable measurement setup for SAW devices operating at UHF has been developed. It is based on a ceramic chip carrier clamped on a metal ground plate that can be inserted into a tube oven and interrogated via coaxial cables. All interconnections except for the SAW device itself are clamped with metallic springs. Thus, the chip carrier can easily be inserted and removed from the measurement setup. The selected geometry and materials allow a simultaneous operation up to frequencies of 3.5 GHz and temperatures of 1000degC. To introduce the coaxial cables into the quartz glass tube, a vacuum tight feed through is used. So, influences of different atmospheres like laboratory air, inert gases or vacuum on the behavior of the SAW devices can be studied. Four similar test units can be inserted into the tube allowing in-situ measurements of up to four two port devices. The design aspects of the setup and first measurements of SAW test devices on langasite are presented.

AB - A HT stable measurement setup for SAW devices operating at UHF has been developed. It is based on a ceramic chip carrier clamped on a metal ground plate that can be inserted into a tube oven and interrogated via coaxial cables. All interconnections except for the SAW device itself are clamped with metallic springs. Thus, the chip carrier can easily be inserted and removed from the measurement setup. The selected geometry and materials allow a simultaneous operation up to frequencies of 3.5 GHz and temperatures of 1000degC. To introduce the coaxial cables into the quartz glass tube, a vacuum tight feed through is used. So, influences of different atmospheres like laboratory air, inert gases or vacuum on the behavior of the SAW devices can be studied. Four similar test units can be inserted into the tube allowing in-situ measurements of up to four two port devices. The design aspects of the setup and first measurements of SAW test devices on langasite are presented.

KW - Surface acoustic wave devices

KW - Frequency

KW - Atmospheric measurements

KW - Semiconductor device measurement

KW - Coaxial cables

KW - Testing

KW - Land surface temperature

KW - UHF measurements

KW - Ceramics

KW - Ovens

UR - https://ieeexplore.ieee.org/document/5168136/

U2 - 10.1109/FREQ.2009.5168136

DO - 10.1109/FREQ.2009.5168136

M3 - Conference Paper

SN - 978-1-4244-3510-4

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BT - 2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum

T2 - 2009 IEEE International Frequency Control Symposium Joint with the 22nd European Frequency and Time forum

Y2 - 20 April 2009 through 24 April 2009

ER -

Characterisation setup of SAW devices at high temperatures and ultra high frequencies

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Keywords

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