Fleury, C., Zhytnytska, R., Bychikhin, S., Cappriotti, M., Hilt, O., Visalli, D., Meneghesso, G., Zanoni, E., Würfl, J., Derluyn, J., Strasser, G. & Pogany, D., 2013, In: Microelectronics Reliability.
Research output: Contribution to journal › Article › peer-review