Abstract
Ballistic electron emission microscopy (BEEM) has been used to study MBE grown Al0.4Ga0.6As/GaAs superlattice structures at variable temperature. The influence of the superlattice miniband manifests itself even at 300 K by a considerable lowering of the collector current threshold voltage compared to the threshold measured on samples with a thick Al0.4Ga0.6As barrier. On the other hand, reference samples with neither a superlattice nor a barrier give low thresholds, as expected for a Au/GaAs Schottky barrier. The temperature dependence of the threshold for the superlattice sample agrees excellently with self-consistent Schrödinger-Poisson calculations of the structure. © 1998 Elsevier Science B.V. All rights reserved.
Originalsprache | Englisch |
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Seiten (von - bis) | 850-853 |
Seitenumfang | 4 |
Fachzeitschrift | Physica E: Low-dimensional Systems and Nanostructures |
Jahrgang | 2 |
Ausgabenummer | 1-4 |
DOIs | |
Publikationsstatus | Veröffentlicht - 1998 |
Extern publiziert | Ja |