Probing of superlattice minibands by ballistic electron emission microscopy

C. Eder, J. Smoliner, R. Heer, G. Strasser, E. Gornik

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

Abstract

Ballistic electron emission microscopy (BEEM) has been used to study MBE grown Al0.4Ga0.6As/GaAs superlattice structures at variable temperature. The influence of the superlattice miniband manifests itself even at 300 K by a considerable lowering of the collector current threshold voltage compared to the threshold measured on samples with a thick Al0.4Ga0.6As barrier. On the other hand, reference samples with neither a superlattice nor a barrier give low thresholds, as expected for a Au/GaAs Schottky barrier. The temperature dependence of the threshold for the superlattice sample agrees excellently with self-consistent Schrödinger-Poisson calculations of the structure. © 1998 Elsevier Science B.V. All rights reserved.
OriginalspracheEnglisch
Seiten (von - bis)850-853
Seitenumfang4
FachzeitschriftPhysica E: Low-dimensional Systems and Nanostructures
Jahrgang2
Ausgabenummer1-4
DOIs
PublikationsstatusVeröffentlicht - 1998
Extern publiziertJa

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