Metal-insulator-metal injector for ballistic electron emission spectroscopy

R. Heer, D. Rakoczy, G. Ploner, G. Strasser, E. Gornik, J. Smoliner

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

Abstract

We introduce a solid-state version of ballistic electron emission microscopy/spectroscopy (BEEM/ BEES) on GaAs-AlGaAs heterostructures using a metal-insulator-metal (MIM) injector structure that replaces the tip of the scanning tunneling microscope (STM). In the present work, the MIM injector is realized by an Al-Al2O3-Al tunnel junction yielding an easy-to-fabricate three-terminal device for ballistic electron spectroscopy. The device principle is applied to several GaAs-AlGaAs structures. The barrier heights obtained from the onsets of the ballistic current spectra are in good agreement with self-consistent calculations as well as earlier experimental results achieved with STM-based BEES. © 1999 American Institute of Physics.
OriginalspracheEnglisch
Seiten (von - bis)4007-4009
Seitenumfang3
FachzeitschriftApplied Physics Letters
Jahrgang75
Ausgabenummer25
DOIs
PublikationsstatusVeröffentlicht - 1999
Extern publiziertJa

Fingerprint

Untersuchen Sie die Forschungsthemen von „Metal-insulator-metal injector for ballistic electron emission spectroscopy“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren