Abstract
We introduce a solid-state version of ballistic electron emission microscopy/spectroscopy (BEEM/ BEES) on GaAs-AlGaAs heterostructures using a metal-insulator-metal (MIM) injector structure that replaces the tip of the scanning tunneling microscope (STM). In the present work, the MIM injector is realized by an Al-Al2O3-Al tunnel junction yielding an easy-to-fabricate three-terminal device for ballistic electron spectroscopy. The device principle is applied to several GaAs-AlGaAs structures. The barrier heights obtained from the onsets of the ballistic current spectra are in good agreement with self-consistent calculations as well as earlier experimental results achieved with STM-based BEES. © 1999 American Institute of Physics.
Original language | English |
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Pages (from-to) | 4007-4009 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 75 |
Issue number | 25 |
DOIs | |
Publication status | Published - 1999 |
Externally published | Yes |