TY - JOUR
T1 - Floating electrometer for scanning tunneling microscope applications in the femtoampere range
AU - Heer, R.
AU - Eder, C.
AU - Smoliner, J.
AU - Gornik, E.
N1 - cited By 19
PY - 1997
Y1 - 1997
N2 - In this work, a floating, high precision current-voltage converter, applicable to scanning tunneling microscopy (STM) and ballistic electron emission microscopy (BEEM) measurements, is described. The electrometer circuit presented shows a bias independent output offset, adds low noise, and has low thermal drift. The amplifier is useful for any floating applications where an ultrasmall current has to be measured with high resolution (±20 fA). The circuit is fast enough for typical sampling rates required for BEEM or STM image measurements and can also be used for fA measurements related to ground. © 1997 American Institute of Physics.
AB - In this work, a floating, high precision current-voltage converter, applicable to scanning tunneling microscopy (STM) and ballistic electron emission microscopy (BEEM) measurements, is described. The electrometer circuit presented shows a bias independent output offset, adds low noise, and has low thermal drift. The amplifier is useful for any floating applications where an ultrasmall current has to be measured with high resolution (±20 fA). The circuit is fast enough for typical sampling rates required for BEEM or STM image measurements and can also be used for fA measurements related to ground. © 1997 American Institute of Physics.
KW - Differential amplifiers
KW - Electric current measurement
KW - Electric currents
KW - Heterojunctions
KW - Performance
KW - Scanning tunneling microscopy
KW - Spurious signal noise
KW - Ballistic electron emission microscopy
KW - Current voltage converter
KW - Floating electrometer
KW - Electrometers
U2 - 10.1063/1.1148418
DO - 10.1063/1.1148418
M3 - Article
SN - 0034-6748
VL - 68
SP - 4488
EP - 4491
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 12
ER -