Floating electrometer for scanning tunneling microscope applications in the femtoampere range

R. Heer, C. Eder, J. Smoliner, E. Gornik

Research output: Contribution to journalArticlepeer-review

Abstract

In this work, a floating, high precision current-voltage converter, applicable to scanning tunneling microscopy (STM) and ballistic electron emission microscopy (BEEM) measurements, is described. The electrometer circuit presented shows a bias independent output offset, adds low noise, and has low thermal drift. The amplifier is useful for any floating applications where an ultrasmall current has to be measured with high resolution (±20 fA). The circuit is fast enough for typical sampling rates required for BEEM or STM image measurements and can also be used for fA measurements related to ground. © 1997 American Institute of Physics.
Original languageEnglish
Pages (from-to)4488-4491
Number of pages4
JournalReview of Scientific Instruments
Volume68
Issue number12
DOIs
Publication statusPublished - 1997
Externally publishedYes

Keywords

  • Differential amplifiers
  • Electric current measurement
  • Electric currents
  • Heterojunctions
  • Performance
  • Scanning tunneling microscopy
  • Spurious signal noise
  • Ballistic electron emission microscopy
  • Current voltage converter
  • Floating electrometer
  • Electrometers

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