@conference{7dd3eeedfa5d441790ab26a6a9632ed4,
title = "Model-Based Mutation Testing of an Industrial Measurement Device.",
author = "Aichernig, {Bernhard K.} and Jakob Auer and Elisabeth J{\"o}bstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Schmidt, {Birgit Vera}",
note = "DBLP's bibliographic metadata records provided through http://dblp.org/search/publ/api are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.",
year = "2014",
doi = "10.1007/978-3-319-09099-3_1",
language = "undefiniert/unbekannt",
pages = "1--19",
}