Raman spectroscopy and photoluminescence imaging for predictive quality monitoring of CIGS solar cells

Martin De Biasio, Johanna Zikulnig, Wolfgang Mühleisen, Marcel Simor, Pieter J. Bolt

Publikation: Konferenzband/Beitrag in Buch/BerichtKonferenzartikelBegutachtung


Novel thin-film solar cells based on Copper Indium Gallium Selenide (CIGS) are an alternative to standard crystalline silicon cells. This work tests whether two proposed optical methods: Micro-Raman spectroscopy (RS) and photoluminescence (PL) imaging, can measure quality parameters of CIGS PV plates during their manufacture. The investigation followed three steps. Step 1: semi-finished CIGS cells were deposited on a soda-lime glass carrier and measured with Raman and PL. The test cells consisted of a Molybdenum (Mo) back contact, a CIGS layer (varied in the absorber thickness), and a CdS layer. The measurements were used to train models for predictive quality monitoring. Step 2: the plates were finished by adding an iZnO buffer layer, ZnO:Al (AZO) front electrode and divided into 32 cells by scribing down to the Mo layer and electrically tested. I-V parameters such as the open circuit voltage VOC, shunt resistance Rsh, and EQE were measured. Step 3: the finished cells were again measured using the two proposed methods to estimate the composition, efficiency, and VOC of the thin-film cells. Our results show that the proposed methods can non-destructively predict the absorber composition and cell electrical parameters and can therefore be used to exclude samples with poor cell performance at an early production stage.
Titel Proc. SPIE 12098
PublikationsstatusVeröffentlicht - 2022

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