IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications

Seyed Mostafa Mousavi; Gabriel Fellner; David Pommerenke; Sandeep Chandra; Ketan Shringarpure; Warwick Ka Kui Wong

doi:10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387

IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications

Seyed Mostafa Mousavi, Gabriel Fellner, David Pommerenke, Sandeep Chandra, Ketan Shringarpure, Warwick Ka Kui Wong

Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

Abstract

ESD discharges to antennas can damage the RF front end. In particular, antennas with highly inductive ground connections allow large ESD-induced voltages at their RF terminals. This work investigates the ESD properties of an RF switch used as an antenna tuner by measuring the voltages and currents at its terminals and building a SPICE model. The goal is to predict the damage threshold when the switch is used in an RF front end.

Originalsprache	Englisch
Titel	2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
Seiten	1012-1017
Seitenumfang	6
DOIs	https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387
Publikationsstatus	Veröffentlicht - 13 Aug. 2021
Extern publiziert	Ja
Veranstaltung	2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium - Raleigh, NC, USA Dauer: 26 Juli 2021 → 13 Aug. 2021

Konferenz

Konferenz	2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
Zeitraum	26/07/21 → 13/08/21

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10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9559387

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@inproceedings{4ae9adc24ebf4202853d236f78ad20cb,

title = "IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications",

abstract = "ESD discharges to antennas can damage the RF front end. In particular, antennas with highly inductive ground connections allow large ESD-induced voltages at their RF terminals. This work investigates the ESD properties of an RF switch used as an antenna tuner by measuring the voltages and currents at its terminals and building a SPICE model. The goal is to predict the damage threshold when the switch is used in an RF front end.",

keywords = "Radio frequency, Antenna measurements, Voltage measurement, Tuners, Capacitors, Switches, SPICE",

author = "Mousavi, {Seyed Mostafa} and Gabriel Fellner and David Pommerenke and Sandeep Chandra and Ketan Shringarpure and Wong, {Warwick Ka Kui}",

year = "2021",

month = aug,

day = "13",

doi = "10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387",

language = "English",

isbn = "978-1-6654-4889-5",

pages = "1012--1017",

booktitle = "2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium",

note = "2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium ; Conference date: 26-07-2021 Through 13-08-2021",

}

Mousavi, SM, Fellner, G, Pommerenke, D, Chandra, S, Shringarpure, K & Wong, WKK 2021, IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications. in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium., 9559387, S. 1012-1017, 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 26/07/21. https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387

TY - GEN

T1 - IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications

AU - Mousavi, Seyed Mostafa

AU - Fellner, Gabriel

AU - Pommerenke, David

AU - Chandra, Sandeep

AU - Shringarpure, Ketan

AU - Wong, Warwick Ka Kui

PY - 2021/8/13

Y1 - 2021/8/13

N2 - ESD discharges to antennas can damage the RF front end. In particular, antennas with highly inductive ground connections allow large ESD-induced voltages at their RF terminals. This work investigates the ESD properties of an RF switch used as an antenna tuner by measuring the voltages and currents at its terminals and building a SPICE model. The goal is to predict the damage threshold when the switch is used in an RF front end.

AB - ESD discharges to antennas can damage the RF front end. In particular, antennas with highly inductive ground connections allow large ESD-induced voltages at their RF terminals. This work investigates the ESD properties of an RF switch used as an antenna tuner by measuring the voltages and currents at its terminals and building a SPICE model. The goal is to predict the damage threshold when the switch is used in an RF front end.

KW - Radio frequency

KW - Antenna measurements

KW - Voltage measurement

KW - Tuners

KW - Capacitors

KW - Switches

KW - SPICE

UR - https://ieeexplore.ieee.org/document/9559387/

U2 - 10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387

DO - 10.1109/EMC/SI/PI/EMCEurope52599.2021.9559387

M3 - Conference Paper

SN - 978-1-6654-4889-5

SP - 1012

EP - 1017

BT - 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium

T2 - 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium

Y2 - 26 July 2021 through 13 August 2021

ER -

IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications

Abstract

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