ESD Susceptibility Analysis: Coupling to Traces and Interconnect

Mehdi Gholizadeh; Seyed Mostafa Mousavi; David Pommerenke; Amin Pak; Gabriel Fellner; Jin Min

doi:10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374

ESD Susceptibility Analysis: Coupling to Traces and Interconnect

Mehdi Gholizadeh, Seyed Mostafa Mousavi, David Pommerenke, Amin Pak, Gabriel Fellner, Jin Min

Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

Abstract

ESD susceptibility scanning is an effective method to find the causes of ESD soft failures in electronic systems. A local probe is used to scan the system for sensitive areas. However, the voltages induced by the probe are often unknown. This paper quantifies the induced voltages from different probes when injected into traces and flex cables, and compares the values to the induced voltages caused by an IEC 61000-4-2 ESD gun in contact mode. The goal is to guide the reader to select voltage levels and probes during susceptibility scans in a way that avoids levels that may be associated with ESD gun injection and cause failure.

Originalsprache	Englisch
Titel	2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
Seiten	1018-1023
Seitenumfang	6
DOIs	https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374
Publikationsstatus	Veröffentlicht - 13 Aug. 2021
Extern publiziert	Ja
Veranstaltung	2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium - Raleigh, NC, USA Dauer: 26 Juli 2021 → 13 Aug. 2021

Konferenz

Konferenz	2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium
Zeitraum	26/07/21 → 13/08/21

Zugriff auf Dokument

10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9559374

Andere Dateien und Links

https://ieeexplore.ieee.org/document/9559374/

Dieses zitieren

@inproceedings{98cdd9961b12405bad315df812aaa1e6,

title = "ESD Susceptibility Analysis: Coupling to Traces and Interconnect",

abstract = "ESD susceptibility scanning is an effective method to find the causes of ESD soft failures in electronic systems. A local probe is used to scan the system for sensitive areas. However, the voltages induced by the probe are often unknown. This paper quantifies the induced voltages from different probes when injected into traces and flex cables, and compares the values to the induced voltages caused by an IEC 61000-4-2 ESD gun in contact mode. The goal is to guide the reader to select voltage levels and probes during susceptibility scans in a way that avoids levels that may be associated with ESD gun injection and cause failure.",

keywords = "Couplings, Flexible printed circuits, Electrostatic discharges, Communication cables, Pins, Magnetic fields, Probes",

author = "Mehdi Gholizadeh and Mousavi, {Seyed Mostafa} and David Pommerenke and Amin Pak and Gabriel Fellner and Jin Min",

year = "2021",

month = aug,

day = "13",

doi = "10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374",

language = "English",

isbn = "978-1-6654-4889-5",

pages = "1018--1023",

booktitle = "2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium",

note = "2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium ; Conference date: 26-07-2021 Through 13-08-2021",

}

Gholizadeh, M, Mousavi, SM, Pommerenke, D, Pak, A, Fellner, G & Min, J 2021, ESD Susceptibility Analysis: Coupling to Traces and Interconnect. in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium., 9559374, S. 1018-1023, 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 26/07/21. https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374

TY - GEN

T1 - ESD Susceptibility Analysis: Coupling to Traces and Interconnect

AU - Gholizadeh, Mehdi

AU - Mousavi, Seyed Mostafa

AU - Pommerenke, David

AU - Pak, Amin

AU - Fellner, Gabriel

AU - Min, Jin

PY - 2021/8/13

Y1 - 2021/8/13

N2 - ESD susceptibility scanning is an effective method to find the causes of ESD soft failures in electronic systems. A local probe is used to scan the system for sensitive areas. However, the voltages induced by the probe are often unknown. This paper quantifies the induced voltages from different probes when injected into traces and flex cables, and compares the values to the induced voltages caused by an IEC 61000-4-2 ESD gun in contact mode. The goal is to guide the reader to select voltage levels and probes during susceptibility scans in a way that avoids levels that may be associated with ESD gun injection and cause failure.

AB - ESD susceptibility scanning is an effective method to find the causes of ESD soft failures in electronic systems. A local probe is used to scan the system for sensitive areas. However, the voltages induced by the probe are often unknown. This paper quantifies the induced voltages from different probes when injected into traces and flex cables, and compares the values to the induced voltages caused by an IEC 61000-4-2 ESD gun in contact mode. The goal is to guide the reader to select voltage levels and probes during susceptibility scans in a way that avoids levels that may be associated with ESD gun injection and cause failure.

KW - Couplings

KW - Flexible printed circuits

KW - Electrostatic discharges

KW - Communication cables

KW - Pins

KW - Magnetic fields

KW - Probes

UR - https://ieeexplore.ieee.org/document/9559374/

U2 - 10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374

DO - 10.1109/EMC/SI/PI/EMCEurope52599.2021.9559374

M3 - Conference Paper

SN - 978-1-6654-4889-5

SP - 1018

EP - 1023

BT - 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium

T2 - 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium

Y2 - 26 July 2021 through 13 August 2021

ER -

ESD Susceptibility Analysis: Coupling to Traces and Interconnect

Abstract

Konferenz

Zugriff auf Dokument

Andere Dateien und Links

Fingerprint

Dieses zitieren