TY - JOUR
T1 - Biased GaAs/AlGaAs superlattices employed as energy filter for ballistic electron emission microscopy
AU - Smoliner, J.
AU - Heer, R.
AU - Strasser, G.
N1 - cited By 0
PY - 1999
Y1 - 1999
N2 - In this work, buried Al0.4Ga0.6As/GaAs superlattices are employed as an energy filter in order to study the energy distribution of the ballistic electron current in ballistic electron emission microscopy (BEEM). As the measured total transmission of the superlattice is in excellent agreement with the calculated transmission, the superlattice is a promising tunable energy filter for studying the energy distribution of ballistic electrons. We further show that due to the large difference in electron masses between the Au base layer and the GaAs collector, parallel momentum conservation leads to considerable electron refraction at the Au/GaAs interface. As a consequence, the energy distribution of ballistic electrons is inverted beyond the Au/GaAs interface.
AB - In this work, buried Al0.4Ga0.6As/GaAs superlattices are employed as an energy filter in order to study the energy distribution of the ballistic electron current in ballistic electron emission microscopy (BEEM). As the measured total transmission of the superlattice is in excellent agreement with the calculated transmission, the superlattice is a promising tunable energy filter for studying the energy distribution of ballistic electrons. We further show that due to the large difference in electron masses between the Au base layer and the GaAs collector, parallel momentum conservation leads to considerable electron refraction at the Au/GaAs interface. As a consequence, the energy distribution of ballistic electrons is inverted beyond the Au/GaAs interface.
KW - Band structure
KW - Gold
KW - Interfaces (materials)
KW - Scanning tunneling microscopy
KW - Semiconducting gallium arsenide
KW - Surface properties
KW - Transmission electron microscopy
KW - Aluminum gallium arsenide
KW - Ballistic electron emission microscopy
KW - Semiconductor superlattices
U2 - 10.1002/(sici)1096-9918(199905/06)27:5/6<542::aid-sia484>3.0.co;2-w
DO - 10.1002/(sici)1096-9918(199905/06)27:5/6<542::aid-sia484>3.0.co;2-w
M3 - Article
SN - 0142-2421
VL - 27
SP - 542
EP - 546
JO - Surface and Interface Analysis
JF - Surface and Interface Analysis
IS - 5
ER -