A technique to model the AC response of diffuse layers at electrode/electrolyte interfaces and to efficiently simulate impedimetric biosensor arrays for many analyte configurations

F. Pittino; L. Selmi

doi:10.1109/SISPAD.2014.6931636

A technique to model the AC response of diffuse layers at electrode/electrolyte interfaces and to efficiently simulate impedimetric biosensor arrays for many analyte configurations

F. Pittino, L. Selmi

Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

Originalsprache	Englisch
Titel	2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
DOIs	https://doi.org/10.1109/SISPAD.2014.6931636
Publikationsstatus	Veröffentlicht - 2014
Extern publiziert	Ja

Zugriff auf Dokument

10.1109/SISPAD.2014.6931636

Andere Dateien und Links

http://www.scopus.com/inward/record.url?eid=2-s2.0-84908676138&partnerID=MN8TOARS

Dieses zitieren

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title = "A technique to model the AC response of diffuse layers at electrode/electrolyte interfaces and to efficiently simulate impedimetric biosensor arrays for many analyte configurations",

author = "F. Pittino and L. Selmi",

year = "2014",

doi = "10.1109/SISPAD.2014.6931636",

language = "English",

booktitle = "2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)",

}

A technique to model the AC response of diffuse layers at electrode/electrolyte interfaces and to efficiently simulate impedimetric biosensor arrays for many analyte configurations. / Pittino, F.; Selmi, L.
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). 2014.

Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

TY - GEN

T1 - A technique to model the AC response of diffuse layers at electrode/electrolyte interfaces and to efficiently simulate impedimetric biosensor arrays for many analyte configurations

AU - Pittino, F.

AU - Selmi, L.

PY - 2014

Y1 - 2014

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84908676138&partnerID=MN8TOARS

U2 - 10.1109/SISPAD.2014.6931636

DO - 10.1109/SISPAD.2014.6931636

M3 - Conference Paper

BT - 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

ER -