Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller.

Jakub Breier, Dirmanto Jap

    Research output: Conference proceeding/Chapter in Book/Report/Conference Paperpeer-review

    Original languageEnglish
    Title of host publicationWESS
    Pages5
    Number of pages1
    DOIs
    Publication statusPublished - 2015

    Cite this