Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrate

Research output: Conference proceeding/Chapter in Book/Report/Conference Paperpeer-review

Abstract

In this work, the behavior of the drift in electrical impedance values of a coupled device constituting a flat rectangular inductor surrounded by a coupled antenna while subjected to mechanical stresses of over 10,000 bending-stretching cycles has been studied. It has shown correlation with mechanical aging and also is influenced by temperature variations on the device surface. The impact of the mechanical stress was studied separately for the bending-stretching and relaxation phases, considering in both cases the effect of temperature changes and mechanical stress, in order to obtain an adjustment equation for the measured experimental data. . From the fit, it was observed that when using an exponential function for the drift effect due to mechanical stress, the experimental curve was fitted with R 2 =0.91 for the bending-stretching phase and R 2 =0.79 for the relaxation phase.
Original languageEnglish
Title of host publication2022 Argentine Conference on Electronics (CAE)
Pages37-40
DOIs
Publication statusPublished - 10 Mar 2022

Keywords

  • Flexible electronics
  • Electrical impedance drift
  • Bending-stretching mechanical stress
  • Degradation
  • Exponential fitting

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