Abstract
The recently proposed RP-CCDM testing method is tested alongside the more established CDM and CC-TLP methods on two test ICs to assess the RP-CCDM's efficacy as an alternate test method. High bandwidth analysis of field induced CDM spark events is presented to evaluate higher frequency components of the current.
Original language | English |
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Title of host publication | 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) |
Pages | 1-10 |
Number of pages | 10 |
Volume | 43 |
DOIs | |
Publication status | Published - 1 Oct 2021 |
Externally published | Yes |
Event | 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) - Tucson, AZ, USA Duration: 26 Sept 2021 → 1 Oct 2021 |
Conference
Conference | 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) |
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Period | 26/09/21 → 1/10/21 |
Keywords
- Surface cleaning
- Surface impedance
- Impedance measurement
- Bandwidth
- Discharges (electric)
- Pins
- Sparks