Noise Characterization of an Event-Based Imager

D. Gigena Ivanovich, G. Vilches, P. Julián, G. Fernandez Moroni

Research output: Conference proceeding/Chapter in Book/Report/Conference Paperpeer-review

Abstract

This work presents a characterization of an event-based CMOS imager using the Photon Transfer Curve methodology, which allows to estimate performance parameters like Fixed Pattern Noise, Conversion Gain, Read Noise and Quantum Efficiency. The imager is a 127 × 127 pixel array, with 40μm pitch and processing in the pixel, fabricated in a 90nm CMOS technology.
Original languageEnglish
Title of host publication2021 Argentine Conference on Electronics - Congreso Argentino de Electronica 2021, CAE 2021
PublisherIEEE Computer Society
Pages32-39
Number of pages8
ISBN (Print)9781728175799
DOIs
Publication statusPublished - 12 Mar 2021
Event2021 Argentine Conference on Electronics (CAE) - Bahia Blanca, Argentina
Duration: 11 Mar 202112 Mar 2021

Publication series

Name2021 Argentine Conference on Electronics - Congreso Argentino de Electronica 2021, CAE 2021

Conference

Conference2021 Argentine Conference on Electronics (CAE)
Period11/03/2112/03/21

Keywords

  • CMOS Image Sensor
  • Fixed Pattern Noise
  • Photon Transfer Curve

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