Improved MEMS based FT-IR spectrometer

A. Tortschanoff, M. Lenzhofer, A. Frank, A. Kenda, T. Sandner, H. Schenk

Research output: Contribution to conference (No Proceedings) › Paper › peer-review

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TY - CONF

T1 - Improved MEMS based FT-IR spectrometer

AU - Tortschanoff, A.

AU - Lenzhofer, M.

AU - Frank, A.

AU - Kenda, A.

AU - Sandner, T.

AU - Schenk, H.

PY - 2009/11/19

Y1 - 2009/11/19

UR - https://www.mendeley.com/catalogue/198c1553-f6f8-3d46-b425-e1f9af3cd0a0/

U2 - 10.1109/isot.2009.5326109

DO - 10.1109/isot.2009.5326109

M3 - Paper

ER -