Original language | English |
---|---|
Article number | 3 |
Pages (from-to) | 237-251 |
Number of pages | 15 |
Journal | J. Hardw. Syst. Secur. |
Volume | 1 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2017 |
Extensive Laser Fault Injection Profiling of 65 nm FPGA.
Jakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan
Research output: Contribution to journal › Article › peer-review