Descrambling of embedded SRAM using a laser probe

S. Chef, C.T. Chua, J.Y. Tay, Y.W. Siah, S. Bhasin, J. Breier, C.L. Gan

    Research output: Conference proceeding/Chapter in Book/Report/Conference Paperpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
    DOIs
    Publication statusPublished - 2018

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