Research output per year
Research output per year
- 13 results
Search results
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2022
Photoluminescence Imaging for Industrial Quality Control during Manufacturing of Thin-Film Solar Cells
Zikulnig, J., Mühleisen, W., Simor, M., Gevaerts, V. & De Biasio, M., 8 Dec 2022, IEEE Sensors Conference 2022. 2022 IEEE SensorsResearch output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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Raman spectroscopy and photoluminescence imaging for predictive quality monitoring of CIGS solar cells
De Biasio, M., Zikulnig, J., Mühleisen, W., Simor, M. & Bolt, P. J., 2022, Proc. SPIE 12098.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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2021
Erweitertes PV Anlagenmonitoring kann Wartungsnotwendigkeit aufzeigen
Mühleisen, W., Neumaier, L., Kosel, J., Hirschl, C., Rattenberger, R. & Prasser, P., Feb 2021, Tagungsband Ret.Con 2021.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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Inline inspection of CIGS solar cells by means of Raman spectroscopy and photoluminescence imaging
Biasio, M. D., Mühleisen, W., Zikulnig, J., Kraft, M., Simor, M. & Bolt, P., 2021, Next-Generation Spectroscopic Technologies XIV. Profeta, L. T. M., O'Hara, J. F. & Barnett, S. M. (eds.). Vol. 11725. p. 8 - 14Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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PV plant monitoring needs both – data analysis and on-site inspection
Mühleisen, W., Neumaier, L., Kosel, J., Hirschl, C., Rattenberger, R. & Prasser, P., Sept 2021, (In preparation) EU PVSEC Conference Proceedings.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper
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Repair of cracked polyamide backsheets
Voronko, Y., Eder, G. C., Breitwieser, C., Muhleisen, W., Neumaier, L., Lenck, N., Feldbacher, S. & competence, P., 2021, Conference Record of the IEEE Photovoltaic Specialists Conference.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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2020
Eddy-Current Analysis Method for Non-Destructive Characterization of Electrical Contacts and Solder Joints in PV Modules
Neumaier, L., Mühleisen, W., Lenzhofer, M., Malago, P. & Hirschl, C., 7 Sept 2020, EU PVSEC Conference Proceedings. 37 ed. p. 904 - 907 4 p.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
Open Access -
Operation and Evaluation of a Bifacial PV Module Test Setup
Mühleisen, W., Neumaier, L., Hirschl, C., Löschnig, J., Burgers, T., Bende, E. & Zamini, S., Sept 2020, EU PVSEC Conference Proceedings.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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Raman Spectroscopy as a Possible In-Line Inspection Tool for CIGS Solar Cells in Comparison with Photoluminescence Measurements
Zikulnig, J., Harms, K., Mühleisen, W., Neumaier, L., Bolt, P. J., Simor, M. & De Biasio, M., Sept 2020, 37th EU PVSEC . p. 698 - 703Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
Open Access -
The Need for an Accuracy Check of Irradiation Sensors for Photovoltaic Power Plants
Mühleisen, W., Neumaier, L., Hirschl, C., Makula, M., Streit, B., Gräfe, M. & Gradwohl, C., Sept 2020, EU PVSEC Conference Proceedings.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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2017
Low silver content, lead free modules with light capturing ribbons
Schwark, M., Mühleisen, W., Neumaier, L. & Hirschl, C., 2017, 2017 6th International Conference on Clean Electrical Power: Renewable Energy Resources Impact, ICCEP 2017.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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2013
Investigation of potential induced degradation (PID) of solar modules from different manufacturers
Schwark, M., Berger, K., Ebner, R., Ujvari, G., Hirschl, C., Neumaier, L. & Muhleisen, W., 2013, IECON Proceedings (Industrial Electronics Conference).Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review
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2012
Investigation of charge carrier dynamics in silicon wafers using terahertz imaging spectroscopy
Arnold, T., De Biasio, M., Mühleisen, W. & Leitner, R., 2012, 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings.Research output: Conference proceeding/Chapter in Book/Report/ › Conference Paper › peer-review