Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrate

H. M. R. Giannetta, G. Maroli, S. Pazos, S. Boyeras, F. Aguirre, A. Fontana, M. Volpe, A. Oliva, B. Mandal, B. Augustine, M. D. Perez, R. Augustine, Pedro Julian, F. Palumbo

Publikation: Konferenzband/Beitrag in Buch/BerichtKonferenzartikelBegutachtung

Abstract

In this work, the behavior of the drift in electrical impedance values of a coupled device constituting a flat rectangular inductor surrounded by a coupled antenna while subjected to mechanical stresses of over 10,000 bending-stretching cycles has been studied. It has shown correlation with mechanical aging and also is influenced by temperature variations on the device surface. The impact of the mechanical stress was studied separately for the bending-stretching and relaxation phases, considering in both cases the effect of temperature changes and mechanical stress, in order to obtain an adjustment equation for the measured experimental data. . From the fit, it was observed that when using an exponential function for the drift effect due to mechanical stress, the experimental curve was fitted with R<sup>2</sup>=0.91 for the bending-stretching phase and R<sup>2</sup>=0.79 for the relaxation phase.
OriginalspracheEnglisch
Titel2022 Argentine Conference on Electronics (CAE)
Seiten37-40
Seitenumfang4
DOIs
PublikationsstatusVeröffentlicht - 11 März 2022
Veranstaltung2022 Argentine Conference on Electronics (CAE) - La Rioja, Argentina
Dauer: 10 März 202211 März 2022

Konferenz

Konferenz2022 Argentine Conference on Electronics (CAE)
Zeitraum10/03/2211/03/22

Fingerprint

Untersuchen Sie die Forschungsthemen von „Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrate“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren