Abstract
Copper Indium Gallium Selenide (CIGS) thin-film solar cells are a promising technology, but inline quality
inspection systems are required for efficient high volume production. Tests with two candidate methods: Raman
spectroscopy and photo-luminescence imaging, are reported in this paper. The methods were used to estimate
material compositions of CIGS samples that were varied in absorber thickness and the composition of the CIGS
absorber layer. Our results indicate that both methods can be valuable for contact-free inline inspection during
the manufacture of CIGS solar cells, both individually and in combination.
inspection systems are required for efficient high volume production. Tests with two candidate methods: Raman
spectroscopy and photo-luminescence imaging, are reported in this paper. The methods were used to estimate
material compositions of CIGS samples that were varied in absorber thickness and the composition of the CIGS
absorber layer. Our results indicate that both methods can be valuable for contact-free inline inspection during
the manufacture of CIGS solar cells, both individually and in combination.
Originalsprache | undefiniert/unbekannt |
---|---|
Titel | Next-Generation Spectroscopic Technologies XIV |
Redakteure/-innen | Luisa T. M. Profeta, John F. O'Hara, Steven M. Barnett |
Seiten | 8 - 14 |
Band | 11725 |
Publikationsstatus | Veröffentlicht - 2021 |