Extensive Laser Fault Injection Profiling of 65 nm FPGA.

Jakub Breier; Wei He; Shivam Bhasin; Dirmanto Jap; Samuel Chef; Hock Guan Ong; Chee Lip Gan

doi:10.1007/s41635-017-0016-z

Extensive Laser Fault Injection Profiling of 65 nm FPGA.

Jakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

Originalsprache	Englisch
Aufsatznummer	3
Seiten (von - bis)	237-251
Seitenumfang	15
Fachzeitschrift	J. Hardw. Syst. Secur.
Jahrgang	1
Ausgabenummer	3
DOIs	https://doi.org/10.1007/s41635-017-0016-z
Publikationsstatus	Veröffentlicht - 2017

Zugriff auf Dokument

10.1007/s41635-017-0016-z

https://dblp.org/db/journals/jhss/jhss1.html#BreierHBJCOG17

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author = "Jakub Breier and Wei He and Shivam Bhasin and Dirmanto Jap and Samuel Chef and Ong, {Hock Guan} and Gan, {Chee Lip}",

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AU - Chef, Samuel

AU - Ong, Hock Guan

AU - Gan, Chee Lip

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PY - 2017

Y1 - 2017

U2 - 10.1007/s41635-017-0016-z

DO - 10.1007/s41635-017-0016-z

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JO - J. Hardw. Syst. Secur.

JF - J. Hardw. Syst. Secur.

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