Abstract
Snail tracks are discolorations of the silver fingers on solar cells. We present a measurement system that can detect snail tracks. Their origin is unknown, but they are thought to be linked to micro cracks in the solar cell. Regions with micro cracks on a photovoltaic module were identified using electroluminescence measurements. Based on the electroluminescence data the faulty regions were mapped with a system that uses a combination of Raman and fluorescence spectroscopy. Our results show that our measurement system is a powerful tool for detecting snail tracks.
Originalsprache | Deutsch (Österreich) |
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Titel | 2013 Seventh International Conference on Sensing Technology (ICST) |
Herausgeber (Verlag) | IEEE Computer Society |
Seiten | 334-337 |
Seitenumfang | 4 |
ISBN (Print) | 978-1-4673-5220-8 |
DOIs | |
Publikationsstatus | Veröffentlicht - 5 Dez. 2013 |
Extern publiziert | Ja |
Veranstaltung | 2013 Seventh International Conference on Sensing Technology (ICST) - Wellington, New Zealand Dauer: 3 Dez. 2013 → 5 Dez. 2013 |
Konferenz
Konferenz | 2013 Seventh International Conference on Sensing Technology (ICST) |
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Zeitraum | 3/12/13 → 5/12/13 |
Schlagwörter
- Fluorescence
- Degradation
- Electroluminescence
- Insulation life
- Photovoltaic systems
- Silicon