Benchmark for the Near-Field Problem: Simulation versus Measurement

Ralph Prestros, Karl Hollaus, Bernhard Auinger, Michael Leumüller

Publikation: Konferenzband/Beitrag in Buch/BerichtKonferenzartikelBegutachtung

Abstract

This paper evaluates how exactly impedances and the near field around a typical housing of an electronic based system with openings can be simulated. Two variants of the device under test (DUT) representing typical electronic device housings with balanced and unbalanced feeding were built and simulated. The 3D finite element simulation results showing the electric field strength and impedance plots are compared to near-field and impedance measurements. The results should give a feeling how exactly the shielding effect on the near field of an electronic housing can be simulated.
OriginalspracheEnglisch
Titel2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Seiten1-4
Seitenumfang4
DOIs
PublikationsstatusVeröffentlicht - 25 Sep. 2020
Veranstaltung2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Rome, Italy
Dauer: 23 Sep. 202025 Sep. 2020

Konferenz

Konferenz2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Zeitraum23/09/2025/09/20

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