Analyzing the reduction of test suite redundancy

When testing complex products, one would certainly tend towards implementing an extensive test set in order to stimulate and evaluate the device under scrutiny to the best of one's knowledge. Test suite size is however also directly related to the time needed for its execution, and the related costs drawing on a project's budget. The motivation to keep test suites as small as possible but also achieve maximum effectiveness at identifying faults is thus certainly an obvious one. We focus on algorithms that for a given test suite remove those test eases redundant in terms of fault identification capabilities, with the aim of assuring that the resulting test suite still fulfills certain properties in respect of coverage or mutation scores.