Christoph Mayer, MSc

Suchergebnisse

• 2023

  A New Data Fitting Method for Parasitic Impedances of Power Transistor Packages using Two-Port S-Parameter Measurements

  Moldaschl, T., Woetzel, S., Galvano, M., Mayer, C., Hackl, H. & Binder, A., 10 März 2023, IEEE Annual Southern Power Electronics Conference (SPEC).

  Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

  • Power transistors 100%
  • Scattering parameters 87%
  • Acoustic impedance 56%
  • Electric network analyzers 46%
  • Polychlorinated biphenyls 41%

• High-Speed, Real Time Sensor Data Acquisition and Transfer based on the Raspberry Pi Single Board Computer

  Kokkinis, G., Horn, A., Ibrahim, K., Mayer, C., Teufel, A. & Heer, R., Juli 2023, 2023 International Balkan Conference on Communications and Networking (BalkanCom). S. 1-4 4 S.

  Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung
• 2022

  Development of a Compact Wireless Sensor for Electric Field Measurements

  Lenzhofer, M., Zikulnig, J., Mayer, C. & Kosel, J., Mai 2022, ITG-Fachbericht 303: Sensoren und Messsysteme. VDE. V. G. (Hrsg.). Band 303. S. 268 - 269

  Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung

• 2014

  Optical position detection for MOEMS scanner mirrors with arbitrary trajectories

  Tortschanoff, A., Baumgart, M., Holzmann, D., Mayer, C., Sandner, T. & Kenda, A., 2014, International Conference on Optical MEMS and Nanophotonics.

  Publikation: Konferenzband/Beitrag in Buch/Bericht › Konferenzartikel › Begutachtung
• 2010

  Development of a Flexible Multiprocessor (FPGA/DSP) Platform for a Varity of Applications Shown on a MEMS Based FTIR Spectrometer

  Lenzhofer, M., Kenda, A., Mayer, C. & Rapp, N., 2010.

  Publikation: Konferenzbeitrag › Papier › Begutachtung